Thiết bị đo độ dày lớp phủ bằng tia XHelmut Fischer
FISCHERSCOPE XDL-XYZpT8
Thiết bị đo độ dày lớp phủ bằng tia X
Helmut Fischer
FISCHERSCOPE XDL-XYZpT8
Giá cố định chưa bao gồm thuế GTGT
3.500 €
Tình trạng
Đã qua sử dụng
Vị trí
Borken 

Thông tin về máy móc
Giá & Vị trí
Giá cố định chưa bao gồm thuế GTGT
3.500 €
- Vị trí:
- Einsteinstraße 8a, 46325 Borken, Deutschland

Gọi điện
Chi tiết về đề nghị
- ID tin đăng:
- A22811900
- Số tham chiếu:
- 25371
- Cập nhật:
- lần cuối vào ngày 24.09.2026
Mô tả
HELMUT FISCHER
X-ray fluorescence measuring device / film thickness measuring device
FISCHERSCOPE X-RAY XDL-XYZpT8
Professional X-ray fluorescence measuring system
for film thickness and material analysis
For sale is a used X-ray fluorescence measuring device
from the manufacturer Helmut Fischer GmbH + Co. KG, Germany.
The FISCHERSCOPE X-RAY is suitable for non-destructive film thickness measurement
and material analysis using X-ray fluorescence (XRF).
The system is designed for measurements of functional layers, anti-corrosion layers,
Lhedpfoz Egi Rsx An Iol
and various metallic coatings, and is used in quality assurance, laboratories,
research, and manufacturing.
Technical data:
Manufacturer: Helmut Fischer GmbH + Co. KG
Model: FISCHERSCOPE X-RAY
Type: XDL-XYZpT8
Serial number: SN010002436
Made in Germany
CE marking present
Measuring system:
X-ray fluorescence measuring device (XRF)
For non-destructive film thickness measurement
Suitable for functional layers and anti-corrosion layers
Large measuring chamber with C-shaped slit
Standard X-ray tube
Proportional counter
Fixed aperture and fixed filter
DCM travel 0–80 mm
Electrical data:
Supply voltage: 230 V AC
Frequency: 50–60 Hz
Power consumption: 120 W
Connections:
Power connection
Serial interface (Sub-D)
Other connections as shown in the pictures
Equipment:
Helmut Fischer FISCHERSCOPE X-RAY measuring device
Measuring chamber with protective cover
Software
Operating manual
Additional accessories as shown in the pictures
Areas of application:
Film thickness measurement
Material analysis
X-ray fluorescence analysis (XRF)
Quality assurance
Electroplating
Surface technology
Material testing
Laboratory
Research and development
Scope of supply:
Helmut Fischer FISCHERSCOPE X-RAY XDL-XYZpT8
Software
Operating manual
Scope of supply as shown in the pictures
Condition:
Used
The device comes from a warehouse clearance.
Optical condition as shown in the pictures.
Important note:
The device has not been tested by us and is sold explicitly
as is and without warranty.
The table shown in the photos, as well as other items not explicitly
mentioned, are not part of the sale.
Due to its size and weight, shipping can be arranged via a freight forwarder.
Subject to changes, errors and prior sale.
We will be happy to answer any further questions by telephone.
Tin đăng này được dịch tự động. Có thể có lỗi dịch thuật.
X-ray fluorescence measuring device / film thickness measuring device
FISCHERSCOPE X-RAY XDL-XYZpT8
Professional X-ray fluorescence measuring system
for film thickness and material analysis
For sale is a used X-ray fluorescence measuring device
from the manufacturer Helmut Fischer GmbH + Co. KG, Germany.
The FISCHERSCOPE X-RAY is suitable for non-destructive film thickness measurement
and material analysis using X-ray fluorescence (XRF).
The system is designed for measurements of functional layers, anti-corrosion layers,
Lhedpfoz Egi Rsx An Iol
and various metallic coatings, and is used in quality assurance, laboratories,
research, and manufacturing.
Technical data:
Manufacturer: Helmut Fischer GmbH + Co. KG
Model: FISCHERSCOPE X-RAY
Type: XDL-XYZpT8
Serial number: SN010002436
Made in Germany
CE marking present
Measuring system:
X-ray fluorescence measuring device (XRF)
For non-destructive film thickness measurement
Suitable for functional layers and anti-corrosion layers
Large measuring chamber with C-shaped slit
Standard X-ray tube
Proportional counter
Fixed aperture and fixed filter
DCM travel 0–80 mm
Electrical data:
Supply voltage: 230 V AC
Frequency: 50–60 Hz
Power consumption: 120 W
Connections:
Power connection
Serial interface (Sub-D)
Other connections as shown in the pictures
Equipment:
Helmut Fischer FISCHERSCOPE X-RAY measuring device
Measuring chamber with protective cover
Software
Operating manual
Additional accessories as shown in the pictures
Areas of application:
Film thickness measurement
Material analysis
X-ray fluorescence analysis (XRF)
Quality assurance
Electroplating
Surface technology
Material testing
Laboratory
Research and development
Scope of supply:
Helmut Fischer FISCHERSCOPE X-RAY XDL-XYZpT8
Software
Operating manual
Scope of supply as shown in the pictures
Condition:
Used
The device comes from a warehouse clearance.
Optical condition as shown in the pictures.
Important note:
The device has not been tested by us and is sold explicitly
as is and without warranty.
The table shown in the photos, as well as other items not explicitly
mentioned, are not part of the sale.
Due to its size and weight, shipping can be arranged via a freight forwarder.
Subject to changes, errors and prior sale.
We will be happy to answer any further questions by telephone.
Tin đăng này được dịch tự động. Có thể có lỗi dịch thuật.
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