Máy phân tích kích thước hạt Phân tích hạtBeckman Coulter
LS 13 320 SGL
Máy phân tích kích thước hạt Phân tích hạt
Beckman Coulter
LS 13 320 SGL
VB chưa bao gồm thuế GTGT
7.480 €
Tình trạng
Đã qua sử dụng
Vị trí
Borken 

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Thông tin về máy móc
Giá & Vị trí
VB chưa bao gồm thuế GTGT
7.480 €
- Vị trí:
- Dunkerstrasse 29, 46325 Borken/Burlo, DE
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Chi tiết về đề nghị
- ID tin đăng:
- A19461346
- Số tham chiếu:
- 50443
- cập nhật:
- lần cuối vào ngày 06.08.2025
Mô tả
Particle size analyzer with dry powder system module
Fast and reproducible results in particle analysis, laser diffraction and particle counting
The LS 13 320 from Beckman Coulter can determine the particle size and particle size distribution of a sample using light scattering. For larger particles, it makes use of Frauenhofer diffraction (see information sheet at HELOS/KR). Thanks to Beckman Coulter's Polarization Intensity Differential Scattering (PIDS) technology, the device can also analyse particle sizes that are far smaller than the wavelength of ordinary light.
In a PIDS analysis, the sample is irradiated with polarized light. If the sample particle is much smaller than the wavelength of the irradiated light, the electrons of the particle are excited by the oscillating electric field of the light beam. The electrons oscillate perpendicular to the light beam; an oscillating dipole moment is created. Due to the oscillating dipole moment, it radiates light in all directions with the exception of the direction of the excitation light. Depending on whether the excitation light is vertically or horizontally polarized, the measured signal intensity of the sample Iv or Ih is different at a certain angle. These values depend strongly on the ratio of the particle size to the wavelength. Therefore, in a PIDS measurement, the sample is measured at three different wavelengths, each with one vertical and one horizontal polarization. An algorithm is then able to calculate a particle size distribution from the measurements.
Dry powder system (Tornado module)
The dry powder system module provides reliable results from 400 nm to 3500 µm for all types of homogeneous and heterogeneous samples that can be dispersed dry.
Analytical size range: 400 nm to 3500 µm
- Measures the entire sample according to ISO 13 320
- Programmable shading setting to optimize sample feed
- User-selectable vacuum pressure for maximum dispersion control
Advantages of the LS 13 320 particle size analyzer
Excellent data reproducibility
Reproducibility is one of the most important factors in laser diffraction particle size analysis. Stricter product specifications enable the production of higher quality bulk and particle materials.
Measured size: Particle size, particle size distribution
Measuring method: Light diffraction, PIDS method
Measuring range: 0.017 μm to 2000 μm
Applications: Measurement of particle sizes
Materials: Emulsions such as lotions and creams Dispersions such as paints and PCD
Software version 5.01
Volt: 100-220/240 V
incl. vacuum pump controller
Further articles - new and used - can be found in our store!
International shipping costs on request!
Dkodpewv Sicjfx Ahveu
Fast and reproducible results in particle analysis, laser diffraction and particle counting
The LS 13 320 from Beckman Coulter can determine the particle size and particle size distribution of a sample using light scattering. For larger particles, it makes use of Frauenhofer diffraction (see information sheet at HELOS/KR). Thanks to Beckman Coulter's Polarization Intensity Differential Scattering (PIDS) technology, the device can also analyse particle sizes that are far smaller than the wavelength of ordinary light.
In a PIDS analysis, the sample is irradiated with polarized light. If the sample particle is much smaller than the wavelength of the irradiated light, the electrons of the particle are excited by the oscillating electric field of the light beam. The electrons oscillate perpendicular to the light beam; an oscillating dipole moment is created. Due to the oscillating dipole moment, it radiates light in all directions with the exception of the direction of the excitation light. Depending on whether the excitation light is vertically or horizontally polarized, the measured signal intensity of the sample Iv or Ih is different at a certain angle. These values depend strongly on the ratio of the particle size to the wavelength. Therefore, in a PIDS measurement, the sample is measured at three different wavelengths, each with one vertical and one horizontal polarization. An algorithm is then able to calculate a particle size distribution from the measurements.
Dry powder system (Tornado module)
The dry powder system module provides reliable results from 400 nm to 3500 µm for all types of homogeneous and heterogeneous samples that can be dispersed dry.
Analytical size range: 400 nm to 3500 µm
- Measures the entire sample according to ISO 13 320
- Programmable shading setting to optimize sample feed
- User-selectable vacuum pressure for maximum dispersion control
Advantages of the LS 13 320 particle size analyzer
Excellent data reproducibility
Reproducibility is one of the most important factors in laser diffraction particle size analysis. Stricter product specifications enable the production of higher quality bulk and particle materials.
Measured size: Particle size, particle size distribution
Measuring method: Light diffraction, PIDS method
Measuring range: 0.017 μm to 2000 μm
Applications: Measurement of particle sizes
Materials: Emulsions such as lotions and creams Dispersions such as paints and PCD
Software version 5.01
Volt: 100-220/240 V
incl. vacuum pump controller
Further articles - new and used - can be found in our store!
International shipping costs on request!
Dkodpewv Sicjfx Ahveu
Nhà cung cấp
Lưu ý: Đăng ký miễn phí hoặc đăng nhập, để truy cập tất cả thông tin.
Đã đăng ký từ: 2008
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